J.A. Woollam Company
The J.A. Woollam Company was founded in 1987 by Dr. John A. Woollam.
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Starting as a spin-off from the University of Nebraska, the company has rapidly grown to become a worldwide leader in spectroscopic Ellipsometer. We have been perfecting our technology for over 30 years and have secured over 200 patents.
The M-2000® line of spectroscopic Ellipsometer is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition combine in an extremely powerful and versatile tool. The M-2000 delivers both speed and accuracy.Our patented RCE technology combines Rotating Compensator Ellipsometer with high-speed CCD detection to collect the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations.
The M-2000 is the first Ellipsometer to truly excel at everything from in-situ monitoring and process control to large-area uniformity mapping and general purpose thin film characterization. No other Ellipsometer technology acquires a full spectrum faster.